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Cantilever Spring Pins
Cantilever Spring Pin contacts can achieve high density in a linear array. They also provide "scrub" for flat contact pads to break through oxidation layer. Below is a table of performance data. This design was developed by SEI for generic use. Specific designs are possible to control scrub, spring force, and contact (mounting) geometry.

Pitch: 80 um linear
Force: 5g (@100um travel)
Max. Stroke: 150 um
Scrub Length: 10-15um
Temp. Tested: 125 C
Fatigue Life: 300k
Current Tested: 0.5-1A

Scrub Type Cantilever Probe Pin
Click for larger image
Please feel free to email probepin@sumitomo.com for additional information regarding specifications, quotations, availability, and brochures.
 
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