Contact Probe Pins
Sumitomo Electric Industries has developed Contact Probe Pins for semiconductor testing. Using the LIGA process of deep x-ray lithography, high aspect ratio molds can be produced for extremely small scale and highly accurate electrical contacts.
In the ever increasing world of capability, signal testing is required for higher density semi conductor applications. How far can we push conventional manufacturing?
With the LIGA process, we have been able to achieve contact pitch of 120um. Varying degrees of spring force is also available depending on the contact design. Not only is the process highly accurate, it is also very versatile, allowing for specific design parameters to be controlled.
Although preliminary pins have been made with some feedback and discussions with probe card manufacturers, the LIGA process is open to your specific designs. Generic samples will be available for evaluation within CQ3 2002. Contact us today to get more information about capability, to discuss your designs, or to reserve your sample lot for evaluation.
- More about the LIGA process
- Scrub Type Cantilever Probe Pin
- Pogo Style Vertical Probe Pin
- Pin Tip Configurations
